Crystallographic input data for (001), (110) and (111)-oriented superlattices. Corrigendum
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چکیده
منابع مشابه
Deposition of PZT thin films with {001}, {110}, and {111} crystallographic orientations and their transverse piezoelectric characteristics
Pb(ZrxTi1-x)O3 [PZT] thin films of morphotropic phase boundary (MPB) composition having {001}, {110}, and {111}orientations were fabricated on silicon substrates (111)Pt/Ti/SiO2/Si using a metal organic decomposition spin-coating technique. The influence of crystallographic orientation on the transverse piezoelectric coefficient e31 * of the films have been determined. The largest e31 * was fou...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section B Structural Science Crystal Engineering and Materials
سال: 2013
ISSN: 2052-5192,2052-5206
DOI: 10.1107/s2052519213009068